Whether you are researching for a new purchase or looking to expand your testing capabilities, we have a number of rich application notes for you to explore.
This application note explores advanced packaging metrology solutions using white light interferometry (WLI) and spectral coherence interferometry (SCI).
We offer a rich portfolio of products for the semiconductor market – from high-throughput metrology solutions for wafer analysis to energizing MEMS devices to real-time, comprehensive gas analysis.
Discover how a single metrology module can help control and optimize your 3D IC process loop. Explore remaining silicon thickness (RST), through silicon via (TSV), total silicon thickness, and more.
This application note describes validation of a thermal desorption system for on-line monitoring of a complex mix of VOC hydrocarbons. This includes volatile and very volatile compounds (‘ozone precursors’) in ambient air.
This application note explores the Fourier transform near infrared (FT-NIR) analysis of hydroxyl value in polymer applications, including polyether polyols, isocyanate number during polyurethane reaction and styrene concentration in SBC pellets.
This application note details a fast and simple analytical approach for the quantitation of 9 Cannabinoids of interest using an Agilent 1260 Infinity configured as an ‘entry level’ instrument.
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