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Recorded Aug 17, 2017
During this webinar focuses on the challenging task of measuring mold wafer thickness using non-contact, high-throughput metrology, and improving process control.
Recorded June 20, 2017
Explore three FT-NIR polymer applications, including at-line polyether polyols’ hydroxyl value analysis, real-time isocyanate number monitoring during a polyurethane reaction, and off-line quality control of percentage styrene in styrene copolymers.
Recorded May 9, 2017
The EPA’s PAMS program (Photochemical Assessment Monitoring Stations network) has been enforced since 1993. In the program, US states and local environmental agencies are required to measure volatile hydrocarbons in urban areas affected by significant ground-level ozone pollution.
Recorded May 3, 2017
Various automotive applications of SIFT-MS are described in the webinar, including enhanced tailpipe exhaust gas analysis, emission screening of synthetic and natural vehicle components, and leak detection.
Recorded April 11, 2017
During this webinar, we’ll explore how the SIFT-MS instrument can assist in impurity profiling in pharmaceutical products. Applications include simple formaldehyde analysis, residual solvent analysis, and packaging analysis.
Recorded April 4, 2017
In this webinar, we explore how to use interferometry to measure step height of pads or under bump metallization (UBM) features on wafer structures that are not completely flat and show height variations.
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