Recorded: December 7, 2016
SIFT-MS is a revolutionary advance in trace gas and headspace analysis. SIFT-MS analysis is real-time, comprehensive, selective, and economical. Ingenious application of direct, ultra-soft chemical ionization coupled with mass spectrometric detection makes continuous monitoring simple for both routine and chromatographically challenging compounds (e.g. ammonia, formaldehyde, hydrogen chloride, and hydrogen sulfide).
Direct, broad-spectrum analysis using SIFT-MS provides new opportunities across an extremely wide range of applications. In this webinar, example applications will include formaldehyde analysis to trace levels in air and headspace, real-time ambient air monitoring for VOCs and odorous compounds, and very high-throughput screening of polymers and packaging.
About Syft Technologies
Mark Perkins, Ph.D.,
Senior Applications Chemist,
Mark graduated from the University of Southampton with a PhD in electrochemistry. He was a senior analyst at the Malaysian Rubber Board’s UK research centre, before joining Anatune in 2015. He will introduce SIFT-MS applications that both simplify testing and improve productivity based on the rapid, direct analysis provided by SIFT-MS.
Ph.D., Director of Applications & Marketing,
Vaughan completed his PhD in Physical Chemistry at the University of Canterbury, New Zealand, in 1997 and joined Syft Technologies in 2002. Vaughan directs Syft’s applications and marketing departments. Vaughan has experience across all SIFT-MS application areas, but has focused particularly on air quality.