News & Events
MEMS & Sensors Technical Congress
February 13 – 14, 2018 | Monterey, CA
Quantum Analytics exhibited at the MEMS & Sensors Technical Congress in Monterey, California from February 13 to 14, 2018. At the event, MEMS and sensors communities gathered to focus and collaborate on solutions and industry-wide challenges in general and breakout sessions.
On Wednesday, February 14th, Dr. Julia Brueckner, Application Scientist at Quantum Analytics presented a paper on Digital Holographic Microscopy: The Next Frontier in MEMS Characterization.
The tremendous increase of MEMS end-market segments requires new skill sets and instrumentation that allows for studying novel designs. Maintaining performance at high yield levels, and proven long-term reliability are key. The desire to reduce noise, increase bias stability, and improve resolution relies on investigation methods that show instantaneous response in order to guarantee functionality.
Digital holographic microscopy (DHM) enables measurements of 3D surface topography in real-time without the need of vertical scanning, which differentiates this technology from others like confocal microscopy or white light interferometry. A vertical scan in the z-axis leads to long data acquisition times. In contrast, the DHM can capture the entire 3D information in one single hologram. This single shot data acquisition allows for high-speed imaging at camera rate with sub-nm resolution that is insensitive to noise. Dynamic measurements of 3D topography with changes induced by a mechanical force, a chemical reaction, a temperature or pressure change, or by applying voltage to study MEMS capabilities have now become available.
Moreover, digital holographic microscopy is capable of measuring through glass, liquids, gases, or vacuum, thus allowing for in-situ measurements in any environment. The ability to perform full-field measurements with high lateral and vertical resolution paves the way for investigating new product designs and optimizing geometries for next generation microelectronic devices.
The application examples presented during this talk will clearly illustrate how this technology can provide sample characterization that was previously unachievable.
Julia Brueckner, PhD
Application Scientist, Quantum Analytics
Julia Brueckner received her PhD in Physical Chemistry at the University of Heidelberg, Germany. She worked for Sentronics Metrology, a Germany-based metrology equipment supplier before she was transferred to the US distributor Quantum Analytics. As an applications engineer, Julia is responsible for promoting optical metrology solutions and providing technical support to customers.