During this webinar, we’ll explore how the SIFT-MS instrument can assist in impurity profiling in pharmaceutical products. SIFT-MS is a new tool for real-time, selective and economical trace gas and headspace analysis. SIFT-MS uses soft chemical ionization to quantify volatile compounds, including chromatographically-challenging ones such as formaldehyde, formic acid, and ammonia.
Direct, broad-spectrum analysis using SIFT-MS provides new opportunities across multiple pharmaceutical applications, including:
- Simple formaldehyde analysis
- Residual solvent analysis
- Packaging screening, including residual monomer analysis
Ph.D., Director of Applications & Marketing,
Vaughan completed his PhD in Physical Chemistry at the University of Canterbury, New Zealand, in 1997 and joined Syft Technologies in 2002. Vaughan directs Syft’s applications and marketing departments. Vaughan has experience across all SIFT-MS application areas, but has focused particularly on air quality.
Mark Perkins, Ph.D.,
Senior Applications Chemist,
Mark graduated from the University of Southampton with a PhD in electrochemistry. He was a senior analyst at the Malaysian Rubber Board’s UK research centre, before joining Anatune in 2015. He will introduce SIFT-MS applications that both simplify testing and improve productivity based on the rapid, direct analysis provided by SIFT-MS.