Products • Metrology Solutions
Provide Quality Control & Assurance
Our metrology products are designed to provide quality control and assurance for wafers and semiconductors, films and coatings industries. The technology is based on optical interferometry, which permits extremely fast and highly accurate determination of layer thicknesses and 3D surface topographies, including roughness. The products are suitable both for inline production monitoring of coatings/multilayer films and for offline inspection of wafer substrate thicknesses, 3D topography, as well as the examination of the interior spaces of machined metal components.
Explore our portfolio of metrology solutions
Sentronics Metrology provides metrology products based on optical interferometry technology. Their systems and sensors are used in quality control and assurance applications for wafers, semiconductors, films and coatings industries.
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- New and refurbished instruments available for immediate delivery