News & Events
Revolutionizing Process Control at Semicon West 2017
Quantum Analytics highlights state-of-the-art solutions for the semiconductor market at SEMICON West from July 11 – 13, 2017 in San Francicso, California.
July 11, 2017 (San Francisco, CA) – Quantum Analytics is excited to be participating in another year of SEMICON West, North America’s largest microelectronics show. The trade show takes place Tuesday, July 11, 2017 through Thursday, July 13, 2017 at the Moscone Center in San Francisco, California.
This year, Quantum Analytics is excited to be highlighting products designed to revolutionize process control on their booth 5509 in the Moscone North Hall. Quantum Analytics has partnered with a number of equipment manufacturers to deliver customers a product suite like no other. From high-throughput metrology solutions for wafer analysis to energizing MEMS devices to real-time, comprehensive gas analysis. Our products deliver results that give you better control over your processes and more confidence in your results.
Contact-free, non-destructive, high-speed metrology solutions help keep pace with growing demand for accurate process control. With platforms ranging from table-top to fully-automated systems, the Sentronics metrology systems are totally configurable (optical sensors, stages, and automation) to address particular needs. Measure multi-layer thickness, bow & warp, 3D topography and roughness using one, flexible instrument.
Full field measurements of static and dynamic 3D topography in unrivaled speed using Lyncee Tec’s Digital Holography Microscope (DHM®). Precisely measure, in real time, how materials deform, flex, move, and with sub-nm vertical resolution at any magnification. DHM® opens up a wide range of benefits for innovative R&D and advanced quality control processes as well as material characterization. It functions as an industrial profilometer that is robust against vibrations. We are excited to be offering live demonstrations of the DHM® at this year’s SEMICON West.
Real-Time Gas Analysis
Measure diverse volatile organic compounds (VOCs) and inorganic gases at parts-per-trillion (PPT) trace levels. The selected ion flow tube mass spectrometry instrument (SIFT-MS) from Syft Technologies can be deployed in a number of applications, including the monitoring of airborne molecular contamination in cleanrooms, FOUPs, raw materials and finished product quality screening, as well as stack and fenceline monitoring. We are excited to be offering live demonstrations of the Voice200ultra SIFT-MS at this year’s SEMICON West.
We encourage SEMICON West attendees to stop by Booth 5509 and check out a few live demonstrations and speak to our experts.
About Quantum Analytics
Quantum Analytics is a value-added distributor of analytical equipment, offering customized instrument financing solutions and technical services, including cross-platform system integration, installation, training and support. Our products deliver the sensitivity, reliability and performance to meet your application requirements.
The SIFT-MS can be deployed in a number of applications, including the monitoring of airborne molecular contamination in cleanrooms.
Measure multi-layer thickness, bow & warp, 3D topography and roughness using one, flexible metrology system.