Upcoming Breakfast Seminar
ASMS 2017: SIFT-MS Breakfast Seminar
Take your analysis to new levels! Join us on Tuesday June 6th for a Breakfast Seminar on the SIFT-MS technique.
Selected Ion Flow Tube Mass Spectrometry, or SIFT-MS, is a technique that is revolutionizing trace analysis across a wide range of industries. During this breakfast seminar, we will take a deeper dive into the technology. We’ll explore real-time and automated trace analysis of volatile organic and inorganic compounds in both gas and headspace.
This free breakfast seminar is a great opportunity to learn about SIFT-MS, its automation, and its applications. Seminar presenters from Syft Technologies include Dr. Diandree Padayachee, Applications Specialist and William Mills, Applications Scientist.
- The fundamentals of the SIFT-MS analytical technique, including its ability to comprehensively analyze samples in real time.
- How SIFT-MS compares with traditional gas analysis methods, including GC-MS and HPLC.
- SIFT-MS automation options for high sample throughput.
- Key applications of SIFT-MS.
Tuesday, June 6, 2017
Indiana Convention Center, Room 245
100 South Capitol Ave, Indianapolis, IN 46225
7:00 am – 8:15 am