The SurveyIR FTIR Microanalysis Accessory is an exciting new accessory that offers ease-of-use features at an affordable price. It combines superior visual clarity and unique illumination options with simple camera controls. This allows the sample to be found quickly with precision, and enables the collection of the infrared spectrum of the exact spot to identify it accurately.
The SurveyIR can upgrade nearly any FTIR to create a solution for defect or failure analysis, art conservation, archeology or forensic analysis problems. The system is compact and easy to install, which makes it ideal for use in the lab or in the field. Unique features, including oblique illumination and view through ATR bring together the optimum visual quality with confidence in the chemical identification, making the SurveyIR an invaluable tool
- Uses on board FT-IR spectrometer detector
- Research grade visual image quality, 1900μm field of view to find sample easily, viewing the entire sample area
- 2X optical magnification yields .7μm/pixel at sample plane to see small samples clearly
- Transmission, reflection, and oblique illumination modes
- IR Reflection, Attenuated Total Reflection, and transmission modes available
- Diamond and Germanium (Ge) ATR prisms
- 5X magnification aspheric objective and condenser
- Simultaneous Sample/IR View – see sample and spectrum in real time
- Variable remote IR image mask – 2000μm, 250μm, 200μm, 160μm, 100μm, or 60μm fixed diameter – controlled via eSpot™ software
- eSpot™ software control of visual illumination modes, visible illumination intensity, ATR contact alert, IR mask selection, and IR transmission/reflection modes
Quick identification of contaminants can improve efficiency and reduces costs. This application note outlines how the SurveyIR FTIR microspectroscopy accessory make this analysis accessible to QC and production laboratories.
This tech note outlines how the SurveyIR FTIR microspectroscopy accessory, when paired with an FTIR instrument, can perform accurate sample identification.
This application note describes an application where a microscope interfaced with a FTIR spectrometer can provide the necessary composition information to identify microplastics, a major source of marine and environmental pollution.