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Syft Technologies Announces Dual-Polarity SIFT-MS for Trace Gas Analysis
Syft Technologies – the world leader in real-time trace volatile organic compound (VOC) analysis – has launched a revolutionary dual-polarity chemical ionization source for its Selected Ion Flow Tube Mass Spectrometry (SIFT-MS) instruments at the 64th Conference on Mass Spectrometry and Allied Topics (ASMS) in San Antonio, TX. This innovation has further strengthened the position of SIFT-MS as the ultimate, all-purpose gas analysis tool for laboratories, industrial process lines and remote monitoring sites.
SIFT-MS is the leading real-time technique for comprehensive, direct gas analysis to ultra-trace levels because it utilizes unique gas-phase chemical separation. By applying ultra-soft, precisely controlled chemical ionization coupled with mass spectrometric detection, SIFT-MS rapidly quantifies both VOCs and inorganic gases to low part-per-trillion concentrations by volume (pptv) with a very wide linear range (Figure 1).
The innovative dual-polarity ion source adds five negatively charged reagent ions (O–, O2–, OH–, NO2–, and NO3–) to the suite of existing positive reagent ions (H3O+, NO+, and O2+), enabling many inorganic gases to be detected and quantified instantly. These reagent ions provide unprecedented selectivity and breadth of detection via multiple reaction mechanisms based on chemical separation rather than chromatography. The key benefits that the eight reagent ions provide are unparalleled selectivity and detection of an extremely broad range of compounds in real time.
The unique use of a quadrupole mass spectrometer to select and switch reagent ions (Figure 2) means that multiple reagent ions can be applied in a single analysis – even when analyzing single human breath exhalations lasting only a few seconds. This gives SIFT-MS unsurpassed selectivity for applications that require continuous or high-throughput analysis, while eliminating chromatographic separation that slows down analysis.
Syft Technologies has revolutionized trace gas analysis with its new dual-polarity chemical ionization source for SIFT-MS. Organic and inorganic compounds are selectively detected and quantified in real time in one simple analysis using eight rapidly switchable reagent ions. Coupled with its simplicity and industry-proven reliability, SIFT-MS is the ideal analytical tool for multiple applications ranging from industry and environmental through to laboratory and research.