Vehicle emissions have always been a concern in the automotive industry. Regulators and consumers demand increasingly lower levels of gaseous emissions from diverse automotive and aerospace sources. These sources range from combustion exhaust, component emissions, and leakage. Emission compositions vary widely between sources, but frequently consist of both volatile organic compounds (VOCs) and inorganic gases.
Speciation and quantitation of these emissions at increasing lower levels are challenges for existing process monitoring instruments. From R&D to the process line, the SIFT-MS instrument allows timely decisions to be made from new product development right through to production.
- Enhanced tailpipe exhaust gas analysis
- Emission screening of synthetic and natural vehicle components
- Leak detection
Duration: 45 minutes
Presenting Partner: Syft Technologies
Vaughan Langford, Ph.D
Director of Applications & Marketing, Syft Technologies
Vaughan completed his PhD in Physical Chemistry at the University of Canterbury, New Zealand, in 1997 and joined Syft Technologies in 2002. Vaughan directs Syft’s applications and marketing departments. Vaughan has experience across all SIFT-MS application areas, but has focused particularly on air quality.
Automotive Application Specialist, Syft Technologies
Yan holds a BSc (Biochemistry) and ME (Chemical and Process Engineering) degrees from the University of Canterbury. Yan joined Syft Technologies in early 2014 as an application specialist, providing technical support for the development of new SIFT-MS applications with a focus on the vehicle emission and process control industries.