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Czitek SurveyIR FTIR Microscope

The Czitek SurveyIR FTIR Microscope offers the analytical power of an infrared microscope at the price point of a sample compartment accessory.

The SurveyIR FTIR Microanalysis Accessory is an exciting new accessory that offers ease-of-use features at an affordable price. It combines superior visual clarity and unique illumination options with simple camera controls. This allows the sample to be found quickly with precision, and enables the collection of the infrared spectrum of the exact spot to identify it accurately. The SurveyIR can upgrade nearly any FTIR to create a solution for defect or failure analysis, art conservation, archeology or forensic analysis problems. The system is compact and easy to install, which makes it ideal for use in the lab or in the field. Unique features, including oblique illumination and view through ATR bring together the optimum visual quality with confidence in the chemical identification, making the SurveyIR an invaluable tool

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Features

Uses on board FT-IR spectrometer detector
Research grade visual image quality, 1900μm field of view to find sample easily, viewing the entire sample area
2X optical magnification yields .7μm/pixel at sample plane to see small samples clearly
Transmission, reflection, and oblique illumination modes
IR Reflection, Attenuated Total Reflection, and transmission modes available
Diamond and Germanium (Ge) ATR prisms
5X magnification aspheric objective and condenser
Simultaneous Sample/IR View – see sample and spectrum in real time
Variable remote IR image mask – 2000μm, 250μm, 200μm, 160μm, 100μm, or 60μm fixed diameter – controlled via eSpot™ software
eSpot™ software control of visual illumination modes, visible illumination intensity, ATR contact alert, IR mask selection, and IR transmission/reflection modes

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